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1

A new SIMPLORER model for single-electron transistors

A. Boubaker, Na. Sghaier, M. Troudi, A. Kalboussi, N. Baboux, A. Souifi

Journal:

Microelectronics Journal

Year:

2007

Language:

english

File:

PDF, 720 KB

english, 2007

2

Macro-modeling for the compact simulation of single electron transistor using SIMPLORER

M. Troudi, Na. Sghaier, A. Boubaker, A. Souifi, A. Kalboussi

Journal:

Microelectronics Journal

Year:

2007

Language:

english

File:

PDF, 249 KB

english, 2007

3

[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Tozeur, Tunisia (2008.03.25-2008.03.27)] 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - A SPICE model for single electron transistor applications at low temperatures: Inverter and ring oscillator

Boubaker, A., Troudi, M., Sghaier, Na., Souifi, A., Baboux, N., Kalboussi, A.

Year:

2008

Language:

english

File:

PDF, 371 KB

english, 2008

4

Photo-active traps effect on photo-detection time of single electron photodetector

Chatbouri, S., Troudi, M., Sghaier, Na., Kalboussi, A., Souifi, A.

Journal:

Optik - International Journal for Light and Electron Optics

Year:

2018

Language:

english

File:

PDF, 2.06 MB

english, 2018

5

Influence of interface states and deep levels on output characteristics of InAlAs/InGaAs/InP HEMTs

S. Bouzgarrou, Na. Sghaier, M.M. Ben Salem, A. Souifi, A. Kalboussi

Journal:

Materials Science and Engineering: C

Year:

2008

Language:

english

File:

PDF, 496 KB

english, 2008

6

Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications

Na. Sghaier, M. Trabelsi, Ne. Sghaier, L. Militaru, A. Souifi, A. Kalboussi, N. Yacoubi

Journal:

Microelectronics Journal

Year:

2006

Language:

english

File:

PDF, 207 KB

english, 2006

7

Electrical characteristics and modelling of multi-island single-electron transistor using SIMON simulator

A. Boubaker, M. Troudi, Na. Sghaier, A. Souifi, N. Baboux, A. Kalboussi

Journal:

Microelectronics Journal

Year:

2009

Language:

english

File:

PDF, 565 KB

english, 2009

8

Traps identification in silicon nanocrystals memories by low noise technique

Ne. Sghaier, Na. Sghaier, M. Troudi, L. Militaru, A. Kalboussi, A. Souifi

Journal:

Materials Science and Engineering: C

Year:

2008

Language:

english

File:

PDF, 465 KB

english, 2008

9

Analysis of photogenerated random telegraph signal in single electron detector (photo-SET)

Troudi, M., Sghaier, Na., Kalboussi, A., Souifi, A.

Journal:

Year:

2010

Language:

english

File:

PDF, 2.29 MB

english, 2010

10

[IEEE 2009 6th International Multi-Conference on Systems, Signals and Devices (SSD) - Djerba, Tunisia (2009.03.23-2009.03.26)] 2009 6th International Multi-Conference on Systems, Signals and Devices - Single photon counting with two quantum dots capacitively coupled

Troudi, M., Sghaier, Na., Boubaker, A., Kalboussi, A., Souifi, A.

Year:

2009

Language:

english

File:

PDF, 753 KB

english, 2009

11

Study of photogenerated traps in nanopixels by random telegraph signal and low frequency noise

Troudi, M., Sghaier, Na., Kalboussi, A., Souifi, A.

Journal:

The European Physical Journal Applied Physics

Year:

2010

Language:

english

File:

PDF, 675 KB

english, 2010

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